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Plastic Deformation-Induced Nanocrystalline Aluminum in Al-BasedAmorphous Alloys

Published online by Cambridge University Press:  15 February 2011

H. Chen ,
Y. He ,
G. J. Shiflet  and
S. J. Poon
H. Chen
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903, U.S.A.
Y. He
Affiliation:
Department of Physics, University of Virginia, Charlottesville, VA 22903, U.S.A.
G. J. Shiflet
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903, U.S.A.
S. J. Poon
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903, U.S.A.
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Abstract

We report the first direct observation of crystallization induced in theslipped planes of aluminum based amorphous alloys by bending the amorphousribbons. Nanometer-sized crystalline precipitates are found exclusivelywithin a thin layer (shear band) in the slipped planes extending across thedeformed amorphous alloy ribbons. It is also found that the nanocrystallinealuminum can be produced by ball-Milling. It is likely that local atomicrearrangements within the shear bands create the nanocrystals which appearafter plastic deformation.

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References

REFERENCES

1. Luborsky, F.E., Amorphous Metallic Alloys (Butterworth, Boston 1983).Google Scholar
2. Guntheroldt, H.J. and Beck, H., Glassy Metals (Springer-Verlag, New York, 1981).Google Scholar
3. Wei, G. and Cantor, B., Acta Met., 37, 3409 (1989).Google Scholar
4. Koster, U. and Witteler, B.P., MRS Symp. Proc., 80, 355 (1987).Google Scholar
5. Muller, K. and Heimendahl, M.V., J. Mat. Sci., 17, 2525 (1982).Google Scholar
6. Miyoshi, K. and Buckley, D.H., Thin Solid Films, 118, 363 (1984).Google Scholar
7. Koster, U., Mat. Sci. Eng., 97, 233 (1988).Google Scholar
8. He, Y., Poon, S.J. and Shiflet, G.J., Science, 241, 1640 (1988).Google Scholar
9. Shiflet, G.J., He, Y. and Poon, S.J., Scripta Met., 22, 1661 (1988).Google Scholar
10. Shiflet, G.J., He, Y. and Poon, S.J., J. Appl. Phys., 64, 6863 (1988).Google Scholar
11. He, Y., Poon, S.J. and Shiflet, G.J., Scripta Met., 22, 1813 (1988).Google Scholar
12. Inoue, A., Ohtera, K., Tsai, A.P. and Masumoto, T., Jpn. J. Appl. Phys., 27, L479 (1988).Google Scholar
13. He, Y., Chen, H., Shiflet, G.J. and Poon, S.J., Phil. Mag. Lett., 61, 297 (1990).Google Scholar
14. Chen, H., He, Y., Shiflet, G.J. and Poon, S.J., Scripta Met., 25, 1421 (1991).Google Scholar
15. Chen, H., PhD Dissertation (University of Virginia, Charlottesville, Virginia 1992).Google Scholar
16. Inoue, A., Ohtera, K., Tao, Z. and Masumoto, T., Jpn. J. Appl. Phys., 27, L1853 (1988).Google Scholar
17. Kim, Y.H., Inoue, A. and Masumoto, T., Mater. Trans. JIM, 31, 747 (1990).Google Scholar