XRD analysis of plasma-vapor-deposited ErT2 films during aging (T decay to 3He) reveals an hkl-dependent unit-cell expansion in which (200) grains expand out-of-plane as much as 0.01 Å more than (111) out-of-plane grains. Texture analysis of an aged ErT2 film reveals a bimodal (111)/(200) out-of-plane preferred orientation. sin2 ψ analysis reveals significant in-plane macro-strain due to 3He bubble formation/growth. The mechanistic origins regarding these observations are also discussed.