Hostname: page-component-cb9f654ff-hn9fh Total loading time: 0 Render date: 2025-08-23T11:11:31.787Z Has data issue: false hasContentIssue false
  • English
  • Français

Line profile analysis at the Universities of Rennes and Birmingham: 1967 to 2000

Published online by Cambridge University Press:  01 March 2012

J. Ian Langford
J. Ian Langford
Affiliation:
Honorary Senior Research Fellow, School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, United Kingdom
Get access Rights & Permissions [Opens in a new window]

Abstract

From 1967 to 2000 Daniel Louër of the Department of Crystal Chemistry, University of Rennes, and J. Ian Langford of the Department of Physics, University of Birmingham, collaborated in studying structural imperfections by means of high-resolution X-ray powder diffractometry. They contributed to the theory and practice of line profile analysis and investigated the microstructure of a variety of nanocrystalline materials. Although many of the projects undertaken were part of the research programme at Rennes to investigate the mechanisms of solid-state reactions, the work is relevant in other fields of materials science.

Keywords

Powder diffractionline profile analysismicrostructurenanocrystalline materialsinstrumental line broadening

Information

Type
Invited Articles
Information
Powder Diffraction , Volume 20 , Issue 4 , December 2005 , pp. 278 - 283
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Auffrédic, J. P., Boultif, A., Langford, J. I., and Louër, D. (1995). “Early stages of crystallite growth in ZnO obtained from an oxalate precursor,” J. Am. Ceram. Soc.JACTAW10.1111/j.1151-2916.1995.tb08803.x 78, 323–328.CrossRefGoogle Scholar
Delhez, R., de Keijser, Th. H., Langford, J. I., Louër, D., Mittemeijer, E. J., and Sonneveld, E. J. (1993). “Crystal imperfection broadening and peak shape in the Rietveld Method,” in The Rietveld Method, edited by Young, R. A. (IUCr∕Oxford University Press, Oxford), pp. 132–166 (2nd ed., 1995).CrossRefGoogle Scholar
Dong, Y. H. and Scardi, P. (2000). “MARQX: A new program for whole-powder-pattern-fitting,” J. Appl. Crystallogr.JACGAR10.1107/S002188989901434X 33, 184–189.CrossRefGoogle Scholar
Fawcett, T. G., Crowder, C. E., Brownell, S. J., Zhang, Y., Hubbard, C., Schreiner, W., Hamill, G. P., Huang, T. C., Sabino, E., Langford, J. I., Hamilton, R., and Louër, D. (1988). “Establishing an instrumental peak profile calibration standard for powder diffraction analysis,” Powder Diffr.PODIE2 3, 209–218.Google Scholar
Langford, J. I. (1978). “A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function,” J. Appl. Crystallogr.JACGAR10.1107/S0021889878012601 11, 10–14.CrossRefGoogle Scholar
Langford, J. I. (1980). “Accuracy of crystallite size and strain determined from the integral breadth of powder diffraction lines,” in Accuracy in Powder Diffraction, edited Block, S. and Hubbard, C. R., NBS Spec. Pub. No. 567 (U.S. Department of Commerce, Gaithersburg, MD).Google Scholar
Langford, J. I. and Louër, D. (1981). “Analysis of line shape in structure refinement and studies of crystal imperfections,” Institut Laue-Langevin Annual Report 157.Google Scholar
Langford, J. I. and Louër, D. (1982). “Diffraction line profiles and Scherrer constants for materials with cylindrical crystallites,” J. Appl. Crystallogr.JACGAR0021-8898 10.1107/S0021889882011297 15, 20–26.CrossRefGoogle Scholar
Langford, J. I. and Louër, D. (1991). “High resolution powder diffraction studies of copper (II) oxide,” J. Appl. Crystallogr.JACGAR 24, 149–155.CrossRefGoogle Scholar
Langford, J. I. and Louër, D. (1996). “Powder diffraction,” Rep. Prog. Phys.RPPHAG10.1088/0034-4885/59/2/002 59, 131–234.Google Scholar
Langford, J. I., Cernik, R. J., and Louër, D. (1991). “The breadth and shape of instrumental line profiles in high resolution powder diffraction,” J. Appl. Crystallogr.JACGAR10.1107/S0021889891004375 24, 913–919.CrossRefGoogle Scholar
Langford, J. I., Louër, D., and Scardi, P. (2000). “Effect of a crystallite size distribution on X-ray diffraction line profiles and whole pattern fitting,” J. Appl. Crystallogr.JACGAR10.1107/S002188980000460X 33, 964–974.CrossRefGoogle Scholar
Langford, J. I., Louër, D., and Wilson, A. J. C. (1980). “Scherrer constants for cylinders,” in Proceedings of 10th Conference on Applied Crystallography, Kozubnik, Poland, edited by Bojarski, Z. and Bold, T. (Silesian University, Katowice), pp. 176–181.Google Scholar
Langford, J. I., Boultif, A., Auffrédic, J. P., and Louër, D. (1993). “The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate ZnO,” J. Appl. Crystallogr.JACGAR10.1107/S0021889892007684 26, 22–33.CrossRefGoogle Scholar
Langford, J. I., Louër, D., Sonneveld, E. J., and Visser, J. W. (1986). “Applications of total pattern fitting to a study of crystallite size and strain in powder zinc oxide,” Powder Diffr.PODIE2 1, 211–221.Google Scholar
Langford, J. I., Wellhöfer, F., Louër, D., and Cernik, R. J. (1989). “Applications of synchrotron radiation to a study of the microcrystalline properties of the high T c ceramic YBa2Cu3O7−,” in Synchrotron Radiation, Daresbury Laboratory Annual Report 1988∕89, p. 52.Google Scholar
Le Bail, A. and Louër, D. (1978). “Smoothing and validity of crystallite-size distributions from X-ray line-profile analysis,” J. Appl. Crystallogr.JACGAR 11, 50–55.CrossRefGoogle Scholar
Leoni, M. and Scardi, P. (2004). “Nanocrystalline domain distributions from powder diffraction data,” J. Appl. Crystallogr.JACGAR 37, 629–634.Google Scholar
Louër, D. (1992). “State-of-the-art powder-diffraction applications with conventional sealed-tube X-ray sources,” in EPDIC 2: Proceedings of 2nd Powder Diffraction Conference, Enschede, The Netherlands, edited by Delhez, R. and Mittermeijer, E. J. (Trans Tech, Zurich), p. 7.Google Scholar
Louër, D. and Langford, J. I. (1988). “Peak shape and resolution in conventional diffractometry with monochromatic X-rays,” J. Appl. Crystallogr.JACGAR10.1107/S002188988800411X 21, 430–437.CrossRefGoogle Scholar
Louër, D. and Langford, J. I. (1993). Various contributions, in Computational Methods in X-ray Crystallography, edited by El-Sayed, K. and Radwan, M., Proceedings of 4th Egyptian School of Crystallography, Aswan, 16–23 January 1993.Google Scholar
Louër, D., Weigel, D., and Langford, J. I. (1972). “Etude des profiles de raies de diffraction des rayons X d’hydroxide de nickel,” J. Appl. Crystallogr.JACGAR 5, 353–359.CrossRefGoogle Scholar
Louër, D., Weigel, D. and Louboutin, R. (1969). “Méthode directe de correction des profiles de raies de diffraction des rayons X. I. Méthode numerique de déconvolution,” Acta Crystallogr., Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr.ACACBN10.1107/S0567739469000544 25, 335–338.CrossRefGoogle Scholar
Nusinovici, J. and Rehfeldt-Osierski, A. (1990). “DIFFRACT-AT search∕match and profile-fitting programs,” in Abstracts: Powder Diffraction Satellite Meeting, Toulouse, 1990, p. 315.Google Scholar
Plévert, J., Louër, D., and Langford, J. I. (1990). “Study of super-Lorentzian diffraction line profiles,” in Abstracts: Powder Diffraction Satellite Meeting, Toulouse, 1990, p. 77.Google Scholar
Scardi, P. and Leoni, M. (2002). “Whole Powder Pattern Modelling,” Acta Crystallogr., Sect. A: Found. Crystallogr.ACACEQ 58, 190–200.Google Scholar
Sonneveld, E. J. and Visser, J. W. (1975). “Automatic collection of powder data from Photographs,” J. Appl. Crystallogr.JACGAR10.1107/S0021889875009417 8, 1–7.CrossRefGoogle Scholar
Stokes, A. R. (1948). “A numerical Fourier-analysis method for the correction of widths and shapes of lines on X-ray powder photographs,” Proc. Phys. Soc. LondonPPSOAU10.1088/0959-5309/61/4/311 61, 382–391.CrossRefGoogle Scholar
Vargas, R., Louër, D. and Langford, J. I. (1983). “Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites,” J. Appl. Crystallogr.JACGAR10.1107/S0021889883010924 16, 512–518.CrossRefGoogle Scholar
Williamson, G. K. and Hall, W. H. (1953). “X-ray line broadening from filed aluminum and wolfram,” Acta Metall.AMETAR10.1016/0001-6160(53)90006-6 1, 22–31.CrossRefGoogle Scholar
Wilson, A. J. C. (1962). “Variance as a measure of line broadening,” Nature (London)NATUAS 193, 568–569.CrossRefGoogle Scholar
Young, R. A., Gerdes, R. G., and Wilson, A. J. C. (1967). “Propagation of some systematic errors in X-ray line profile analysis,” Acta Crystallogr.ACCRA910.1107/S0365110X67000271 22, 155–162.CrossRefGoogle Scholar