Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Lee, Byung-Teak
Shin, Jong-Yoon
Kim, Seon-Hoon
Kim, Jin-Hyeok
Han, Sang-Yoon
and
Lee, Jong Lam
2003.
Investigation of Ti/Al and TiN/Al thin films as the stable ohmic contact for p-type 4H-SiC.
Journal of Electronic Materials,
Vol. 32,
Issue. 6,
p.
501.