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Stability of Pbl-xEuxTe Alloys

Published online by Cambridge University Press:  28 February 2011

L. Salamanca-Young ,
M. Wuttig  and
S. Nahm
L. Salamanca-Young
Affiliation:
University of Maryland, College Park, MD 20742, D.L. Partin and J. Hermans, General Motors Research Laboratories, Warren, MI 48090.
M. Wuttig
Affiliation:
University of Maryland, College Park, MD 20742, D.L. Partin and J. Hermans, General Motors Research Laboratories, Warren, MI 48090.
S. Nahm
Affiliation:
University of Maryland, College Park, MD 20742, D.L. Partin and J. Hermans, General Motors Research Laboratories, Warren, MI 48090.
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Abstract

We present high resolution transmission electron microscopy results of Pbl-x Eux Te alloys that show evidence for a compositional instability for x ≈ 0.5 when the alloys are grown on BaF2 substrates. The Pbl-x Eux Te solid solution becomes stable at room temperature if a buffer layer of PbTe is grown on the BaF2 substrate prior to thegrowth of the Pb1-x Eux Te layer. The stabilization ofthe Pb1-x Eux Te solid solution is the result of the additional energy term due to the strain between the Pbl-x Eux Te film and the PbTe buffer layer. The estimated critical temperatures for decomposition of the Pb1-x Eux Te alloys with and without the PbTe buffer layer are ≈0 K and.≈ 366 K, respectively in accord with our1 experimental observations. We also present models for the structure of the decomposed phaseand use them to obtain simulated images using computing methods. The simulated images are compared with those obtained experimentally.

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References

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