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Soft-Mode Phonons in SrTiO3 Thin Films Studied by Far-Infrared Ellipsometry and Raman Scattering

Published online by Cambridge University Press:  10 February 2011

A. A. Sirenko ,
C. Bernhard ,
A. Golnik ,
I. A. Akimov ,
A. M. Clark ,
J.-H. Hao  and
X. X. Xi
A. A. Sirenko
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, sirenko@phs.psu edu
C. Bernhard
Affiliation:
Max-Planck-Institut für Festkörperforschung, D-70569 Stuttgart, Germany
A. Golnik
Affiliation:
Max-Planck-Institut für Festkörperforschung, D-70569 Stuttgart, Germany
I. A. Akimov
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, sirenko@phs.psu edu
A. M. Clark
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, sirenko@phs.psu edu
J.-H. Hao
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, sirenko@phs.psu edu
X. X. Xi
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, sirenko@phs.psu edu
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Abstract

We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 µm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm−1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 603: Symposium KK – Materials Issues for Tunable RF & Microwave Devices , 1999 , 245
Copyright
Copyright © Materials Research Society 2000

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