Hostname: page-component-54dcc4c588-sq2k7 Total loading time: 0 Render date: 2025-10-06T05:44:31.948Z Has data issue: false hasContentIssue false
  • English
  • Français

Simulation and Processing of High Resolution Images of Defects and Interfaces in Superconducting YBa2Cu3O7

Published online by Cambridge University Press:  28 February 2011

H. W. Zandbergen ,
R. Gronsky ,
K. Wang  and
G. Thomas
H. W. Zandbergen
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
R. Gronsky
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
K. Wang
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
G. Thomas
Affiliation:
National Center for Electron Microscopy, and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
Get access

Extract

The superconducting performance, in particular the critical current, of polycrystalline YBa2Cu3O7 will depend strongly on the structure of grain boundaries and the nature and number of defects in the microstructure. To characterize the atomic structure of defects and grain boundaries in these materials, a high resolution electron microscopy study has been initiated. Emphasis has been placed on the technique of phase contrast imaging with corresponding computer simulation and processing for optimum interpretation of results.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 553
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Gronsky, R. and Thomas, G., in Proc. 41st Ann. Meeting Elec. Microscopy Soc. Amer., Bailey, G.W., ed., Claitor's, Baton Rouge (1983) p. 310.Google Scholar
2. Saxton, W.O., Inst. Phys. Conf. Ser. 44, Institute of Phys., London (1978).Google Scholar
3. Kilaas, R., in Proc. Microbeam Analysis Society (1987), (in press).Google Scholar
4. Zandbergen, H.W., Gronsky, R., Wang, K., and Thomas, G., (to be published).Google Scholar
5. Zandbergen, H.W., Gronsky, R., and Thomas, G., phys. stat. sol. (a) (1987) (in press).Google Scholar
6. Gronsky, R., in Treatise on Materials Science and Technology; Experimental Techniques, vol. 19B, Herman, H. (ed.), Academic Press, 1983, p. 325.Google Scholar