Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Suchaneck, G
Lin, W.-M
Koehler, R
Sandner, T
Gerlach, G
Krawietz, R
Pompe, W
Deineka, A
and
Jastrabik, L
2002.
Characterization of RF-sputtered self-polarized PZT thin films for IR sensor arrays.
Vacuum,
Vol. 66,
Issue. 3-4,
p.
473.
Eng, L. M.
Grafström, S.
Loppacher, C.
Lu, X. M.
Schlaphof, F.
Franke, K.
Suchaneck, G.
and
Gerlach, G.
2004.
Nanoscale Characterisation of Ferroelectric Materials.
p.
267.
Eng, L.M.
2005.
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials.
Vol. 186,
Issue. ,
p.
275.
Suchaneck, G.
Solnyshkin, A.V.
Kiselev, D.A.
Bogomolov, A.A.
and
Gerlach, G.
2005.
The LIMM problem for ferroelectric thin films comprising space charge layers.
Journal of the European Ceramic Society,
Vol. 25,
Issue. 12,
p.
2363.
Kholkin, A. L.
Bdikin, I. K.
Kiselev, D. A.
Shvartsman, V. V.
and
Kim, S.-H.
2007.
Nanoscale characterization of polycrystalline ferroelectric materials for piezoelectric applications.
Journal of Electroceramics,
Vol. 19,
Issue. 1,
p.
83.