Hostname: page-component-54dcc4c588-42vt5 Total loading time: 0 Render date: 2025-10-13T08:28:15.273Z Has data issue: false hasContentIssue false

Selectively Absorbing Properties of Sol Gel Dip Coated IndiumTin Oxide Thin Films on A Glass Pane

Published online by Cambridge University Press:  21 February 2011

Hyung-Jin Jung
Affiliation:
Division of Ceramics, Korea Institute of Science and Technology, Seoul 130-650, Korea
Hee-Hyung Lee
Affiliation:
Division of Ceramics, Korea Institute of Science and Technology, Seoul 130-650, Korea
Dong-Heon Lee
Affiliation:
Division of Ceramics, Korea Institute of Science and Technology, Seoul 130-650, Korea
Jeon-Kook Lee
Affiliation:
Division of Ceramics, Korea Institute of Science and Technology, Seoul 130-650, Korea
Get access

Abstract

Selectively absorbing properties of indium tin oxide(ITO) thin film werecharacterized in UV-VIS-NIR wavelength regions. Sodium diffusion from glasspane had a bad influences on the properties of ITO layers. Sosilica-zirconia barrier layers were formed by sol gel dip coating. ITO filmson buffer layered glass pane were formed by sol gel dip coating.Transmittance and reflectivity dependence on the thickness of barrier layerand ITO coating layers were studied by measuring sheet resistance andUV-VIS-NIR spectroscopy.

Transparency at 550 nm wavelegth and selective reflectivities were importantto apply to passive solar collectors. In single barrier layer and six-foldITO coated films, good selectivities were obtained. Homogeneity of indiumtin precursor coating solution was important. Atmosphere condition(humidity, temperature), dip and drawing conditions were also additionalfactors for uniformity of films.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Na, J., Cho, Y., Kim, Y. and Lee, T., J.Am.Ceram.Soc. 72 [4] 698- (1989)CrossRefGoogle Scholar
2. Blandenet, G., Court, M. and Lagarde, Y., Thin Solid Films, 77, 81- (1981)Google Scholar
3. yang, C., Josefowicz, J.Y. and Alexandru, L., Thin Solid Films 74 129- (1981)Google Scholar
4. Pulker, H.K., Thin Solid Films 77, 203- (1981)Google Scholar
5. Dislich, H. and Hhssmann, E., Thin Solid Films 27, 129-(1981)Google Scholar
6. Kundu, D., Biswas, P.K. and Gangyli, D., J.Non-cryst.Sol., 110, 13-(1989)Google Scholar
7. Arfsten, N.J., Kaufmann, R. and Dislich, H., in “Ultrastructure Processing of Ceramics, Glasses, and Composites” Ed. By Hench, L.L. and Ulrich, D.R., 189- (1984).Google Scholar