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Polarization Dependence and Relaxation of the Current in Polycrystalline Ferroelectric Pb(ZrTi)O3 Film

Published online by Cambridge University Press:  08 March 2011

L. A. Delimova ,
V. S. Yuferev ,
A. V. Ankudinov ,
E. V. Gushchina  and
I. V. Grekhov
L. A. Delimova
Affiliation:
Solid State Electronics Division, Ioffe Institute of the Russian Academy of Sciences, Polytekhnicheskaya 26, St.Petersburg, 194021, Russian Federation.
V. S. Yuferev
Affiliation:
Solid State Electronics Division, Ioffe Institute of the Russian Academy of Sciences, Polytekhnicheskaya 26, St.Petersburg, 194021, Russian Federation.
A. V. Ankudinov
Affiliation:
Solid State Physics Division, Ioffe Institute of the Russian Academy of Sciences, Polytekhnicheskaya 26, St.Petersburg, 194021, Russian Federation.
E. V. Gushchina
Affiliation:
Solid State Physics Division, Ioffe Institute of the Russian Academy of Sciences, Polytekhnicheskaya 26, St.Petersburg, 194021, Russian Federation.
I. V. Grekhov
Affiliation:
Solid State Electronics Division, Ioffe Institute of the Russian Academy of Sciences, Polytekhnicheskaya 26, St.Petersburg, 194021, Russian Federation.
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Abstract

Using Scanning Spreading Resistance Microscopy and direct current-voltage measurements, a long-relaxation transport current in polycrystalline PZT films is shown to depend on the polarization direction and voltage rise rate, the latter is typical for a capacitive current. The clockwise current hysteresis is observed at any polarization of the film. We suppose that the long current relaxation is due to recharge of traps, which participate in screening of polarization charges on PZT grain boundaries. The polarization charges response to applied bias for a short time, whereas the traps response to variation of the polarization charges takes much longer time.

Keywords

ferroelectricthin filmelectrical properties

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1292: Symposium K – Oxide Nanoelectronics , 2011 , mrsf10-1292-k03-31
Copyright
Copyright © Materials Research Society 2011

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References

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