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Phase transitions of self-polarized PZT thin films

Published online by Cambridge University Press:  01 February 2011

Gunnar Suchaneck ,
Gerald Gerlach ,
Alexander Deyneka ,
Lubomir Jastrabik ,
Sulkhan T. Davitadze  and
Boris A. Strukov
Gunnar Suchaneck
Affiliation:
Dresden University of Technology, Institute for Solid State Electronics, D-01062 Dresden, Germany.
Gerald Gerlach
Affiliation:
Dresden University of Technology, Institute for Solid State Electronics, D-01062 Dresden, Germany.
Alexander Deyneka
Affiliation:
Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic.
Lubomir Jastrabik
Affiliation:
Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic.
Sulkhan T. Davitadze
Affiliation:
Moscow State University, 11119899, Moscow, Russia
Boris A. Strukov
Affiliation:
Moscow State University, 11119899, Moscow, Russia
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Abstract

Optical properties and thermal properties of self-polarized thin PZT films were determined by variable angle spectral ellipsometry and by the AC hot strip method, respectively. Analyzing the temperature dependencies of the optical gap and the specific heat, evidence of two not as yet observed phase transitions in the ferroelectric was provided. The origin of these phase transitions was attributed to film stress caused by substrate/PZT thin film lattice mismatch and to the presence of a negative space charge layer in the PZT film at the bottom electrode/PZT interface.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 718: Symposium D – Perovskite Materials , 2002 , D8.4
Copyright
Copyright © Materials Research Society 2002

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