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Perpendicular Magnetoresistance of Microstructured Pillars in Fe/Cr Magnetic Multilayers

Published online by Cambridge University Press:  03 September 2012

M.A.M. Gijs ,
S.K.J. Lenczowski  and
J.B. Giesbers
M.A.M. Gijs
Affiliation:
Philips Research Laboratories, 5600 JA Eindhoven, The Netherlands
S.K.J. Lenczowski
Affiliation:
Eindhoven University of Technology, Department of Physics, 5600 MB Eindhoven, The Netherlands
J.B. Giesbers
Affiliation:
Philips Research Laboratories, 5600 JA Eindhoven, The Netherlands
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Abstract

We have fabricated pillar-like microstructures of high vacuum sputtered Fe/Cr Magnetic Multilayers and measured the giant magnetoresistance effect in the configuration where the measuring current is perpendicular to the film plane from 4.2 K to 300 K. At 4.2 K we find a magnetoresistance of 108 % for multilayers with a Fe thickness of 3 nm and a Cr thickness of 1 nm. The pronounced temperature dependence of the perpendicular magnetoresistance is studied for samples with different Cr thicknesses and tentatively explained by electron-Magnon scattering. The low-temperature data are compared with existing low-temperáture models.

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References

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