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Peculiarities of REBCO Films Growth on Single Crystalline Substrates

Published online by Cambridge University Press:  12 October 2011

Constantin G. Tretiatchenko ,
Victor S. Flis ,
Vassily L. Svetchnikov  and
Volodymyr M. Pan
Constantin G. Tretiatchenko
Affiliation:
G. V. Kurdyumov Institute for Metal Physics, 36 Vernadsky Blvd., Kiev, 03142, Ukraine
Victor S. Flis
Affiliation:
G. V. Kurdyumov Institute for Metal Physics, 36 Vernadsky Blvd., Kiev, 03142, Ukraine
Vassily L. Svetchnikov
Affiliation:
G. V. Kurdyumov Institute for Metal Physics, 36 Vernadsky Blvd., Kiev, 03142, Ukraine
Volodymyr M. Pan
Affiliation:
G. V. Kurdyumov Institute for Metal Physics, 36 Vernadsky Blvd., Kiev, 03142, Ukraine
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Abstract

We suggest a model of mismatched interface and calculate its energy in order to describe formation of threading edge dislocations by the mechanism of rotational relaxation of interface stresses. The model takes into account strongly layered perovskite structure of high-temperature superconductors. We have shown that rotational relaxation occurs due to finite size of clusters and to non-equilibrium effect of the film growth. We have predicted the subgrain size and the expected rotation of domains depending on the lattice mismatch. The computed values are consistent with the observed YBCO film nanostructure.

Keywords

superconductingnucleation & growththin film

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References

REFERENCES

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