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Ni Nanoparticles Elaborated with an Ar Ion Polishing Technique

Published online by Cambridge University Press:  21 March 2011

Alejandro Torres-Castro
Alejandro Torres-Castro*
Affiliation:
Enrique López-Cuéllar, Ubaldo Ortiz-Méndez, Juan Aguilar-Garib. FIME, Universidad Autónoma de Nuevo León, A.P. 076 Suc. “F”, Cd. Universitaria C.P. 66450, San Nicolás de los Garza, N.L., México.
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Abstract

Ni nanoparticles where obtained from a Ni sample milled with Ar ions by using a Gatan precision ion polishing system, normally used for Transmission Electron Microscopy (TEM) sample preparation. Deposition of Ni nanoparticles was performed over two different surfaces: on a double sided carbon tape and, on a Cu grid covered with collodion film. A continuos film of Ni was characterized, over the carbon tape by SEM and EDAX techniques. The last surface was analysed by TEM. In both cases, a thin film composed of Ni nanoparticles, was founded and result obtained by TEM, show a nanoparticle diameter of about 4 nm.

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