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Near-Field Imaging of the Microwave Dielectric Properties of Single-Crystal PbTiO3 and Thin-Film Sr1−x Bx TiO3

Published online by Cambridge University Press:  10 February 2011

Y.G. Wang ,
M.E. Reeves ,
W. Chang ,
J.S. Horwitz  and
W. Kim
Y.G. Wang
Affiliation:
Department of Physics, The George Washington University, Washington, DC, 20052
M.E. Reeves
Affiliation:
Department of Physics, The George Washington University, Washington, DC, 20052 Naval Research Laboratory, Washington, DC, 20375
W. Chang
Affiliation:
Naval Research Laboratory, Washington, DC, 20375
J.S. Horwitz
Affiliation:
Naval Research Laboratory, Washington, DC, 20375
W. Kim
Affiliation:
Naval Research Laboratory, Washington, DC, 20375
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Abstract

A PbTiO3 crystal and Sr1−x Bax TiO3 films have been studied by near-field scanning microwave microscopy (SMM). In the PbTiO3 crystal, dielectric properties and topography are obtained simultaneously. In Sr1−x Bax TiO3 films, local variations and sample-to-sample differences are observed. To quantitatively determine local dielectric permittivity and loss, we also carry out theoretical calculations on dependence of resonant frequency and quality factor on dielectric constants of bulk samples and thin films. Good agreements between experimental and theoretical results are obtained.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 603: Symposium KK – Materials Issues for Tunable RF & Microwave Devices , 1999 , 289
Copyright
Copyright © Materials Research Society 2000

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