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Nanotribology of Diamond Films Studied by Atomic Force Microscopy

Published online by Cambridge University Press:  16 February 2011

Gabi Neubauer ,
Sidney R. Cohen ,
Gary M. Mcclelland  and
Hajime Seki
Gabi Neubauer
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120-6099.
Sidney R. Cohen
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120-6099.
Gary M. Mcclelland
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120-6099.
Hajime Seki
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120-6099.
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Abstract

An atomic force microscope, operated in ultra-high vacuum has been employed to study the tribological properties of diamond films under small loads (< 10−6 N) on a nanometer scale. The incidence of intermittent motion, “stick-slip”, while sliding a diamond tip across the diamond film, is detected under certain experimental conditions and is discussed with respect to the difference between static and kinetic friction, sample topography and a varying sample condition.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 188: Symposium K – Thin Films: Stresses and Mechanical Properties II , 1990 , 219
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

[1] Field, J.E., (Editor), Properties of Diamond, Academic Press, London, 1979.Google Scholar
[2] Berman, R., (Editor), Physical Properties of Diamond, Clarendon Press, Oxford, 1965.Google Scholar
[3] Wong, M.S., Meilunas, R., Ong, T.P., Chang, R.P.H., Mat. Res. Soc. Symp. Proc. 140, 483 (1989).Google Scholar
[4] Wong, M.S., Meilunas, R., Ong, T.P., Chang, R.P.H., Appl. Phys. Lett. 54, 2006 (1989).Google Scholar
[5] Johanmir, S., Deckman, D.E., Ives, L.K., Feldman, A., Farabaugh, E., Wear 133, 73 (1989).Google Scholar
[6] Bowden, F.P., F.R.S., J.E. Young, Proc. Roy. Soc. A 208, 444 (1951).Google Scholar
[7] Bowden, F.P., Hanwell, F.R.S., A.E., Proc. Roy. Soc. A 295, 233 (1966).Google Scholar
[8] Bowden, F.P., F.R.S., C.A. Brookes, Proc. Roy. Soc. A 295, 244 (1966).Google Scholar
[9] Seal, M., Proc. Roy. Soc. A 248, 379 (1958).Google Scholar
[10] Seal, M., Phil. Mag. A 43, 587 (1981).Google Scholar
[11] Casey, M., Wilks, J., J. Phys. D Appl. Phys. 6, 1772 (1973).Google Scholar
[12] Samuels, B., Wilks, J., J. Mat. Sci. 23, 2846 (1988).Google Scholar
[13] Tabor, D., in ”The Properties of Diamond”, edited by Field, J.E., Academic Press, London, 1979.Google Scholar
[14] Enomoto, Y., Tabor, D., Proc. Roy. Soc. A 373, 405 (1981).Google Scholar
[15] Binnig, G., Quate, C.F., Gerber, Ch., Phys. Rev. Lett. 56, 930 (1986).Google Scholar
[16] Cohen, S. R., Neubauer, G., McClelland, G. M., to appear in J. Vac. Sci. Tech. (July/August 1990).Google Scholar
[17] Neubauer, G., Cohen, S.R., McClelland, G.M., Horne, D., Mate, C.M., to appear in Rev. Sci. Instr. (1990).Google Scholar
[18] Angus, J.C., Hayman, C.C., Science 241, 915 (1988).Google Scholar
[19] Buck, M., Chuang, T.J., Kaufman, J.H., Seki, H., to be published in MRS Fall Meeting Symposium Proceedings 162, (1990).Google Scholar
[20] Pepper, S.V., J. Vac. Sci. Tech. 20, 643 (1982).Google Scholar
[21] Erlandsson, R., McClelland, G.M., Mate, C.M., Chiang, S., J. Vac. Sci. Tech. A 6, 266 (1988).Google Scholar
[22] Martin, Y., Williams, C.C., Wickramasinghe, H.K., J. Appl. Phys. 61, 4723 (1987).Google Scholar
[23] Bowden, F.P., Tabor, D., The Friction and Lubrication of Solids, Oxford University Press, New York, (1986).Google Scholar
[24] Mate, C.M., McClelland, G.M., Erlandsson, R., Chiang, S., Phys. Rev. Lett. 59, 1942 (1987).Google Scholar
[25] Erlandsson, R., Hadziioannou, G., Mate, C.M., McClelland, G.M., Chiang, S., J. Chem. Phys. 89, 5190 (1988).Google Scholar