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A Method For The Tem Characterisation Of Grain Boundary Films In Ceramics

Published online by Cambridge University Press:  15 February 2011

N.W. Jepps ,
T. F. Page  and
W. M. Stobbs
N.W. Jepps
Affiliation:
Department of Metallurgy and Materials Science, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, England
T. F. Page
Affiliation:
Department of Metallurgy and Materials Science, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, England
W. M. Stobbs
Affiliation:
Department of Metallurgy and Materials Science, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, England
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Abstract

The behaviour of Fresnel fringes with focus has been investigated as a means of characterising grain boundaries in engineering ceramics. This technique, together with dark-field imaging, has been applied to the study of grain boundaries in two hot-pressed silicon carbides. It is demonstrated that these two techniques, applied together, provide the best means of obtaining a complete characterisation of grain boundary films, in terms of width, structure, and composition.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 5: Symposium B – Grain Boundaries in Semiconductors , 1981 , 45
Copyright
Copyright © Materials Research Society 1982

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References

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