Hostname: page-component-54dcc4c588-sdd8f Total loading time: 0 Render date: 2025-10-08T08:36:00.909Z Has data issue: false hasContentIssue false
  • English
  • Français

Magnetic Resonance Studies of Fe/Ag Superlattices with Fe Layers < 6 Monolayers Thick

Published online by Cambridge University Press:  03 September 2012

J. J. Krebs ,
B. T. Jonker  and
G. A. Prinz
J. J. Krebs
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
B. T. Jonker
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
G. A. Prinz
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
Get access

Abstract

X-band magnetic resonance has been used to study a set of Fe/ Ag(001) superlattice (SL) samples with Fe layers only 0.9–5.5 monolayers (ML) thick. The samples (grown by MBE and previously examined by Mossbauer and magnetization techniques) were studied thoughout the 5–300 K range. The SL's with t(Fe) < 3 ML exhibit a marked downturn in their resonance fields below a temperature which decreases with t(Fe) and, simultaneously, the linewidths increase. We suggest that this behavior is due to magnetic relaxation processes in these samples.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Jonker, B.T., Walker, K.-H., Kisker, E., Prinz, G.A., and Carbone, C., Phys. Rev. Lett. 57, 142(1986).CrossRefGoogle Scholar
2. Stampanoni, M., Vaterlaus, A., Aeschlimann, M., and Meier, F., Phys. Rev. Lett.,59 2483(1987).CrossRefGoogle Scholar
3. Heinrich, B., Urquhart, K.E., Arrott, A.S., Cochran, J.F., Myrtle, K., and Purcell, S.T., Phys. Rev. Lett., 59, 1756(1987).Google Scholar
4. Robins, J.L., Celotta, R.J., Unguris, J., Pierce, D.T., Jonker, B.T., and Prinz, G.A., Appl. Phys. Lett. 52, 1918(1988).Google Scholar
5. Koon, N.C., Jonker, B.T., Volkening, F.A., Krebs, J.J., and Prinz, G.A., Phys. Rev. Lett.,59 2463(1987); F. A. Volkening et al., J.Appl. Phys. 63, 3869 (1988).CrossRefGoogle Scholar
6. Krebs, J.J., Jonker, B. T., and Prinz, G.A., J. Appl. Phys. 63, 3467 (1988).CrossRefGoogle Scholar
7. Krebs, J.J., Jonker, B. T., and Prinz, G.A., Proc. 1988 ICM, J. Phys.- Colloq. (to be published).Google Scholar
8. Roy Richter, Gay, J.G. and Smith, John J., J. Vac. Sci. Technol. A 3, 1498(1985), and Phys. Rev. Lett. 54, 2704 (1985).Google Scholar
9. Fu, C.L., Freeman, A.J., and Oguchi, T., Phys. Rev. Lett. 54, 2700 (1985).Google Scholar
10. Gay, J. and Richter, R., Phys. Rev. Lett. 56, 2728(1986).Google Scholar
11. Jonker, B. T., private communication.Google Scholar
12. Yafet, Y. and Gyorgy, E.M., Phys. Rev. B 38, 9145(1988).Google Scholar
13. Volkening, F.A., Jonker, B.T., Krebs, J.J., Prinz, G.A., and Koon, N.C., Proc. 1988 ICM, J. Phys.-Colloq. (to be published).Google Scholar
14. Malozemoff, A. P and Jamet, J.P., Phys. Rev. Lett. 39, 1293(1977).CrossRefGoogle Scholar