Hostname: page-component-54dcc4c588-hp6zs Total loading time: 0 Render date: 2025-10-11T18:52:36.134Z Has data issue: false hasContentIssue false
  • English
  • Français

Kinetics of Photodeposition of Superconducting Films

Published online by Cambridge University Press:  01 January 1992

C. H. Chen ,
R. C. Phillips  and
P. W. Morrison
C. H. Chen
Affiliation:
Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831–6378
R. C. Phillips
Affiliation:
Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831–6378
P. W. Morrison
Affiliation:
Advanced Fuel Research, 87 Church Street, E. Hartford, CT 06108
Get access

Abstract

Kinetics of photodeposition of superconducting films was studied by using real time in-situ monitoring of gas phase species with mass spectrometry and thin-film properties by Fourier Transform Infrared (FTIR) spectrometry. A mass spectrometer was used to study wavelength and power dependent desorbed atoms and molecules during laser ablation process. FTIR was used to monitor the surface properties of thin film. Real time surface temperatures can be easily obtained by FTIR. By combinging mass spectrometry and FTIR, an optimum condition of making high-quality superconducting film can possibly be found.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Bednorz, J. G. and Miller, K. A., Z. Phys. B64, 189 (1986).Google Scholar
2. Wu, M. K., Ashburn, J. R., Torng, C. J., Hor, P. H., Meng, R. L., Gao, L., Huang, Z. T., Wang, Y. Q., and Chu, C. W., Phys. Rev. Lett. 58 908 (1987).Google Scholar
3. Chen, C. H., Payne, M. G., Hurst, G. S., Kramer, S.D., Allman, S. L., and Phillips, R. C., in Lasers and Mass Spectrometry edited by Lubman, D. M. (Oxford University Press, 1990), pp. 1–37.Google Scholar
4. Ready, J. F., Effect of High Power Laser Irradiation (Academic Press, New York, 1971), pp. 172–174.Google Scholar
5. Ying, Q. Y., Kim, S.H., Shaw, D. T., and Kwok, H. S., Appl. Phys. Lett. 55, 1041 (1989).Google Scholar
6. Zheng, Z. Q., Ying, Q. Y., Witanachchi, S., Huang, Z. O., Shaw, D. T., and Kwok, H. S., Appl. Phys. Lett. 54, 954 (1989).Google Scholar