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In-Situ Study of Radiation Damage in V2os Induced by Low Energy Electrons

Published online by Cambridge University Press:  25 February 2011

R. Ai ,
H.-J. Fan ,
P.C. Stair  and
L.D. Marks
R. Ai
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
H.-J. Fan
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
P.C. Stair
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
L.D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
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Abstract

Radiation damage in V2Os induced by electrons in the energy range 0-3 keV has been studied by high resolution electron microscopy, X-ray photoelectron spectroscopy and mass spectrometry. Different phase transformations were observed when V205 was irradiated by electrons of different energies. The damage kinetics and the role of electron radiation enhanced diffusion were investigated. It was found that nucleation and growth of lower oxides was driven by electron radiation enhanced diffusion.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 157: Symposium A – Beam-Solid Interactions: Physical Phenomena , 1989 , 599
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1 Knotek, M.L. and Feibelman, Peter J., Surf. Sci. 90, 78 (1979); Phys. Rev. Lett. 40, 964, (1978); Phys. Rev. B 18, 6531, (1978).Google Scholar
2 Fiermans, L. and Vennik, J., Surf. Sci. 9,187, (1968); 18, 317, (1969); 24, 541 (1971).Google Scholar
3 Tompkins, H.G., Curelaru, I.M., Din, K.S. and Suonine, E., Appl. Surf. Sci. 21, 280 (1985).Google Scholar
4 Fan, H.-J. and Marks, L.D., Ultramicroscopy, accepted.Google Scholar
5 Tully, J.C. in Desorption Induced by Electronic Excitation DIET I, edited by Tolk, N.H, Traum, M.M., Tully, J.C. and Madey, T.E. (Springer-Verlag, New York, 1983), pp 31–38.Google Scholar
6 Colparet, M.N, Clauws, P., Fiermans, L. and Vennik, J., Surf. Sci. 36, 513 (1973).Google Scholar