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Hreels Studies of Kx C60 Thin Films

Published online by Cambridge University Press:  15 February 2011

G.P. Lopinski ,
M.G. Mitch ,
S.J. Chase  and
J.S. Lannin
G.P. Lopinski
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
M.G. Mitch
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
S.J. Chase
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
J.S. Lannin
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
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Abstract

High resolution electron energy loss spectroscopy has been used to investigate the vibrational and electronic excitations of single-phase, crystalline Ax C60 films. Substantial changes in intramolecular mode frequencies and intensities with alkali concentration arise from charge transfer effects as well as free carrier screening. For x=4, splitting of the t1u band is observed, resulting in an insulating phase with an estimated gap of 0.3-0.4eV. Screening in the x=3 phase results in enhanced surface sensitivity and deviations from bulk stoichiometry at the surface of metallic films are observed.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 359: Symposium G – Science and Technology of Fullerene Materials , 1994 , 301
Copyright
Copyright © Materials Research Society 1995

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References

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