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Hexagotnal Silicon: A New Hrem Study

Published online by Cambridge University Press:  21 February 2011

P. Pirouz ,
J. Yang ,
F. Ernst  and
H.-J. Möller
P. Pirouz
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH 44106.
J. Yang
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH 44106.
F. Ernst
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH 44106.
H.-J. Möller
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH 44106.
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Abstract

A new high resolution electron microscopy investigation of indentationinduced hexagonal silicon has been carried out using the JEOL 4000EX electron microscope. The better resolution of the microscope enables one to extract more structural information about this intriguing phase and its interface with the cubic phase. A new structural model for the cubic/- hexagonal interface is presented. Image simlations are carried out over a wide range of thickness and defocus for the new model and also a previous model due to Tan et al.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 199
Copyright
Copyright © Materials Research Society 1989

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References

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