Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Mitchel, William C
Mitchell, William D.
Smith, H. E.
Zvanut, M. E.
and
Lee, Wonwoo
2006.
Electrical Measurement of the Vanadium Acceptor Level in 4H- and 6H-SiC.
MRS Proceedings,
Vol. 911,
Issue. ,
Wang, Langning
Xun, Tao
Yang, Hanwu
Liu, Jinliang
and
Zhang, Yu
2014.
Influence of different illumination profiles on the on-state resistances of silicon carbide photoconductive semiconductor switches.
Review of Scientific Instruments,
Vol. 85,
Issue. 4,
Edinach, E. V.
Krivoruchko, A. D.
Gurin, A. S.
Muzafarova, M. V.
Ilyin, I. V.
Babunts, R. A.
Romanov, N. G.
Badalyan, A. G.
and
Baranov, P. G.
2020.
Application of High-Frequency EPR Spectroscopy for the Identification and Separation of Nitrogen and Vanadium Sites in Silicon Carbide Crystals and Heterostructures.
Semiconductors,
Vol. 54,
Issue. 1,
p.
150.