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The Escape of Particles from a Confining Potential well

Published online by Cambridge University Press:  15 February 2011

James P. Lavine ,
Edmund K. Banghart  and
Joseph M. Pimbley
James P. Lavine
Affiliation:
Microelectronics Technology Division, Eastman Kodak Company, Rochester, NY 14650-2008
Edmund K. Banghart
Affiliation:
Microelectronics Technology Division, Eastman Kodak Company, Rochester, NY 14650-2008
Joseph M. Pimbley
Affiliation:
Department of Mathematical Sciences, Renssalaer Polytechnic Institute, Troy, NY 12180-3590
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Abstract

Many electron devices and chemical reactions depend on the escape rate of particles confined by potential wells. When the diffusion coefficient of the particle is small, the carrier continuity or the Smoluchowski equation is used to study the escape rate. This equation includes diffusion and field-aided drift. In this work solutions to the Smoluchowski equation are probed to show how the escape rate depends on the potential well shape and well depth. It is found that the escape rate varies by up to two orders of magnitude when the potential shape differs for a fixed well depth.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 290: Symposium N – Dynamics in Small Confining Systems , 1992 , 249
Copyright
Copyright © Materials Research Society 1993

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