Hostname: page-component-54dcc4c588-m259h Total loading time: 0 Render date: 2025-10-09T12:22:53.651Z Has data issue: false hasContentIssue false
  • English
  • Français

Enhanced Electrical Conductivity and Nonstoichiometry in Nanocrystalline CeO2-x

Published online by Cambridge University Press:  15 February 2011

E.B. Lavik ,
Y.-M. Chiang ,
I. Kosacki  and
H.L. Tuller
E.B. Lavik
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Y.-M. Chiang
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
I. Kosacki
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
H.L. Tuller
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Get access

Abstract

Dense nanocrystalline CeO2-x. of ∼10 nm grain size exhibits enhanced, PO2-dependent electronic conductivity indicative of intrinsic nonstoichiometric behavior under conditions where coarse-grained counterparts are extrinsic. The enthalpy of reduction is lowered by over 2.4 eV per oxygen vacancy. The nanocrystals also exhibit greatly reduced grain boundary resistance, attributed to grain-size-dependent segregation. We propose that interface doping by selected low energy defect sites dominates the defect and transport properties of nanocrystalline ceria, and possibly other nanocrystalline compounds.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 400: Symposium E – Metastable Metal-Based Phases and Microstructures , 1995 , 359
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Gleiter, H., Progress in Materials Science, 33, 1 (1990);Google Scholar
Siegel, R.W., Ann. Rev. Mater. Sci., 21, 559(1991).Google Scholar
2. Karch, J., Birringer, R., Gleiter, H., Nature, 330, 556 (1987);Google Scholar
Mayo, M.J., Siegel, R.W., Narayanasamy, A., and Nix, W.D., J. Mater. Sci., 5, 1073 (1990)Google Scholar
3. Tschoepe, A. and Ying, J.Y., p. 781 in Nanophase Materials. Hadjipanayis, G.C. and Siegel, R.W., eds., Kluwer Academic Publishers, Netherlands, 1994.Google Scholar
4. Tschoepe, A., Ying, J.Y., and Tuller, H.L, Sensors and Actuators, in press.Google Scholar
5. Chiang, Y.-M., Lavik, E.B., Kosacki, I., Tuller, H.L., and Ying, J.Y., unpublished.Google Scholar
6. Gerhardt, R. and Nowick, A.S., J. Am. Ceram. Soc., 69, 641 (1986);Google Scholar
Gerhardt, R., Nowick, A.S., Mochel, M.E. and Dumler, I., J. Am. Ceram. Soc., 69, 646 (1986).Google Scholar
7. Bauerle, J.E., J. Phys. Chem. Solids, 30, 2657 (1969);Google Scholar
Chu, S.H. and Seitz, M.A., J. Solid State Chem., 23, 297–314 (1979);Google Scholar
Bonanos, N., Steele, B.C.H., and Butler, E.P., p. 191 in Impedance Spectroscopy. MacDonald, J.R., ed., John Wiley and Sons, New York, 1987.Google Scholar
8. Terwilliger, C.D. and Chiang, Y.-M., Acta Metall. Mater., 43, 319 (1995).Google Scholar
9. Aoki, M., Chiang, Y.-M., Kosacki, I., Lee, J.-R., Tuller, H.L., and Liu, Y., J. Am. Ceram. Soc., in press.Google Scholar
10. Tuller, H.L. and Nowick, A.S., J. Electrochem. Soc., 122, 255 (1975).Google Scholar
11. Blumenthal, R.N., Brugner, F.S., and Gamier, J.E., J. Electrochem. Soc., 120, 1230 (1973).Google Scholar
12. Tuller, H.L. and Nowick, A.S., J. Phys. Chem. Solids, 38, 859 (1977).Google Scholar
13. Tuller, H.L. and Nowick, A.S., J. Electrochem. Soc., 126, 209 (1979).Google Scholar