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Electron Microscopy of Stress-Induced Martensite and Pretransition Microstructures in Ni62.5Al37.5

Published online by Cambridge University Press:  25 February 2011

D. Schryvers  and
L.E. Tanner
D. Schryvers
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, R.U.C.A., Groenenborgerlaan 171, B-2020 ANTWERPEN, Belgium
L.E. Tanner
Affiliation:
Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, PO Box 808, LIVERMORE, CA 94550, U.S.A.
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Abstract

Static configurations of stress-induced martensite and pretransition microstructures in Ni62.5A137.5 have been studied with conventional as well as high resolution electron microscopy using single crystal TEM specimens containing defect sites of extremely high stress intensity. From images of different regions around such defects it can be concluded that the austenite lattice develops transverse displacement modulations with increasing amplitude and correlation directly related to the {110}<110> shear-plus-shuffle displacements required to form the martensite structures. Different steps in this transition sequence are presented and discussed.

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