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Correlations Between Electrical Properties and Solid-State Reactions in Co/N-GaAs Contacts: A Bulk and Thin-Film Study

Published online by Cambridge University Press:  25 February 2011

F.-Y. Shiau  and
Y. A. Chang
F.-Y. Shiau
Affiliation:
Department of Materials Science and Engineering University of Wisconsin-Madison Madison, WI 53706
Y. A. Chang
Affiliation:
Department of Materials Science and Engineering University of Wisconsin-Madison Madison, WI 53706
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Abstract

A fundamental and comprehensive approach has been taken to study Co//GaAs interfacial reactions, using phase diagram determination, bulk and thin-film diffusion couple studies, and electrical characterization. Phase formation sequences and interfacial morphologies are found to be similar in bulk and thin-film couples. Thermodynamic and kinetic analyses are used to rationalize the contact formations. The electrical properties of the contacts are correlated to the phase formation sequences and phase diagram information.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 148: Symposium D – Chemistry and Defects in Semiconductor Heterostructures , 1989 , 29
Copyright
Copyright © Materials Research Society 1989

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