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Complex Piezoelectric Coefficients of PZT Ceramics: Method for Direct Measurement of d33

Published online by Cambridge University Press:  10 February 2011

T. L. Jordan ,
Z. Ounaies  and
T. L. Turner
T. L. Jordan
Affiliation:
Data Systems and Instrument Support Branch, NASA Langley Research Center, Hampton, VA 23681
Z. Ounaies
Affiliation:
National Research Council, NASA Langley Research Center, Hampton, VA 23681
T. L. Turner
Affiliation:
Structural Acoustics Branch, NASA Langley Research Center, Hampton, VA 23681
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Abstract

A fiber-optic device is used to determine the magnitude and phase of the strain in the poling direction of lead zirconate titanate (PZT) ceramic wafers. This information yields the real and imaginary components of the piezoelectric strain coefficient d33. The measurement hardware and software are described and results from the measurements of d33 for PZT 4 and 5 H wafers are presented. This method has the advantages of being direct, inexpensive and relatively simple to use. Verification of the results is provided through the use of the resonance method.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 459: Symposium Y – Materials for Smart Systems II , 1996 , 231
Copyright
Copyright © Materials Research Society 1997

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References

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