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Amorphization of PLZT Material by 1.5 MeV Krypton Ion Irradiation with In Situ TEM Observation

Published online by Cambridge University Press:  25 February 2011

L.M. Wang ,
A.Y. Wu  and
R.C. Ewing
L.M. Wang
Affiliation:
Department of Geology, University of New Mexico, Albuquerque, NM 87131
A.Y. Wu
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131
R.C. Ewing
Affiliation:
Department of Geology, University of New Mexico, Albuquerque, NM 87131
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Abstract

PLZT 9/65/35 single crystals were irradiated with 1.5 MeV krypton ions at 25–450°C in the HVEM-Tandem Facility at Argonne National Laboratory. In-situ TEM was performed during irradiation in order to determine the critical amorphization dose. At room temperature, the material was completely amorphized after a dose of only 1.9×1014 ions/cm2, less than one fifth of the critical amorphization dose for silicon (1×1015 ions/cm2). The critical amorphization dose for the PLZT material increased with increasing irradiation temperature. At 450°C, amorphization was not observed after a dose of 1.1×10 15ions/cm2.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 268: Symposium K – Materials Modification by Energetic Atoms and Ions , 1992 , 343
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Higuma, Y., Matsui, Y., Okuyama, M., Nakagawa, T. and Hamakawa, Y., Jap. J. Appl. Phys. Suppl. 11, 209 (1978).CrossRefGoogle Scholar
2. Wu, A.Y., Wang, F., Juang, C.B. and Bustamante, C., Proceedings of the 7th International Conference on the Application of Ferroelectric Materials (Urbana, Illinois, 1990) p. 643.Google Scholar
3. Land, C.E. and Peercy, P.S., Ferroelectrics 45, 25 (1982).CrossRefGoogle Scholar
4. Title, M.A., Walpita, L.M., Chen, W., Lee, S.H. and Chang, W.S.C., Applied Optics 25, 1508 (1986).CrossRefGoogle Scholar
5. Navrotsky, A. and Weidner, D.J., Perovskite: A Structure of Great Interest to Geophysics and Materials Science (American Geophysical Union, 1989), p. 146.CrossRefGoogle Scholar
6. Allen, C.W., Funk, L.L., Ryan, E.A. and Ockers, S.T., Nucl. Instr. and Meth. B40/41, 553 (1989).CrossRefGoogle Scholar
7. Ziegler, J.F., Biersack, J.P. and Littmark, U., The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).Google Scholar
8. Alexander, D.E. (private communication).Google Scholar
9. Wang, L.M. and Ewing, R.C., MRS Bulletin 18(5) (1992), in press.Google Scholar
10. Wang, L.M. and Birtcher, R.C., Philos. Mag. A64, 1209 (1991).Google Scholar
11. Birtcher, R.C. and Wang, L.M., Nucl. Instr. and Meth. B59/60, 966 (1991).Google Scholar