Hostname: page-component-54dcc4c588-trf7k Total loading time: 0 Render date: 2025-10-12T06:02:20.194Z Has data issue: false hasContentIssue false
  • English
  • Français

Interference Effects In X-Ray Specular Reflectivity from Thin Films

Published online by Cambridge University Press:  15 February 2011

S. Lagomarsino ,
S. Di Fonzo ,
W. Jark ,
B. Muller ,
A. Cedola  and
G. Pelka
S. Lagomarsino
Affiliation:
Istituto di Elettronica dello Stato Solido - CNR V. Cineto Romano, 42 00156 Roma, (Italy)
S. Di Fonzo
Affiliation:
Sincrotrone Trieste - Padriciano 99, 34012 Trieste, (Italy)
W. Jark
Affiliation:
Sincrotrone Trieste - Padriciano 99, 34012 Trieste, (Italy)
B. Muller
Affiliation:
Sincrotrone Trieste - Padriciano 99, 34012 Trieste, (Italy)
A. Cedola
Affiliation:
Istituto di Elettronica dello Stato Solido - CNR V. Cineto Romano, 42 00156 Roma, (Italy)
G. Pelka
Affiliation:
Institute of Physics, Al. Lotnikov 32/48 -02-668 Warsaw, (Poland)
Get access

Abstract

A strong resonance effect in the specular reflectivity of a C layer deposited on a Ni surface has been measured. The e.m. field intensity distribution has been monitored by measuring the fluorescence intensity of an ultra-thin Ti layer placed in the C film. The reflected intensity and the fluorescence yield of Ti and Ar (this last trapped in the film because of the deposition by sputtering) have been measured in different samples with a different location of the Ti layer. The results show that with this method a nondestructive, accurate determination of the Ti position can be achieved with a relative accuracy of 10−2

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 382: Symposium G – Structure and Properties of Multilayered Thin Films , 1995 , 381
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Parratt, L.G., Phys. Rev. 95, 359 (1954)Google Scholar
[2] Bedzyk, M.J., Bommarito, G.M. and Schildkraut, J.S., Phys. Rev. Lett., 62, 1376 (1989)Google Scholar
[3] Boer, D.K.G. de, Phys. Rev., 44, 498 (1991)Google Scholar
[4] Wang, J., Bedzyk, M.J. and Caffrey, M., Science, 258,775 (1992)Google Scholar