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Impurity Incorporation During Si Ultrafast Solidification to theCrystalline and Amorphous Phase

Published online by Cambridge University Press:  25 February 2011

Salvatore Ugo Campisano
Salvatore Ugo Campisano*
Affiliation:
Dipartimento di Fisica dell'Università, Corso Italia 57, 95129 Catania, Italy
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Abstract

Impurity segregation at the liquid-solid interface, interfacialinstabilities due to constitutional supercooling and precipitation arecompared for the growth of a crystalline or of an amorphous phase from rapidsolidification. Segregation at low concentration and interfacialinstabilities at high concentrations are shown to give the same information.The impurity behaviour shows a distinct similarity between the crystallineand amorphous phases.

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References

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