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Materials Advances through Aberration-Corrected Electron Microscopy

Published online by Cambridge University Press:  31 January 2011

S.J. Pennycook ,
M. Varela ,
C.J.D. Hetherington  and
A.I. Kirkland
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Abstract

Over the last few years, the performance of electron microscopes has undergone a dramatic improvement, with achievable resolution having more than doubled. It is now possible to probe individual atomic sites in many materials and to determine atomic and electronic structure with single-atom sensitivity. This revolution has been enabled by the successful correction of the dominant aberrations present in electron lenses. In this review, the authors present a brief overview of these instrumental advances, emphasizing the new insights they provide to several areas of materials research.

Keywords

electron energy loss spectroscopy (EELS)scanning transmission electron microscopy (STEM)transmission electron microscopy (TEM).

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Type
Research Article
Information
MRS Bulletin , Volume 31 , Issue 1 , January 2006 , pp. 36 - 43
Copyright
Copyright © Materials Research Society 2006

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