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Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films

Published online by Cambridge University Press:  01 December 2005

F. Berberich ,
H. Graafsma ,
B. Rousseau ,
A. Canizares ,
R. Ramy Ratiarison ,
N. Raimboux ,
P. Simon ,
P. Odier ,
N. Mestres  and
T. Puig
...Show all authors
F. Berberich
Affiliation:
ESRF, 38043 Grenoble Cedex 9, France
H. Graafsma
Affiliation:
ESRF, 38043 Grenoble Cedex 9, France
B. Rousseau*
Affiliation:
CNRS – CRMHT, 45071 Orléans, France
A. Canizares
Affiliation:
CNRS – CRMHT, 45071 Orléans, France
R. Ramy Ratiarison
Affiliation:
CNRS – CRMHT, 45071 Orléans, France
N. Raimboux
Affiliation:
CNRS – CRMHT, 45071 Orléans, France
P. Simon
Affiliation:
CNRS – CRMHT, 45071 Orléans, France
P. Odier
Affiliation:
CNRS-Laboratoire de Cristallographie, 38402 Grenoble, France
N. Mestres
Affiliation:
ICMAB-CSIC, Campus de la Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain
T. Puig
Affiliation:
ICMAB-CSIC, Campus de la Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain
X. Obradors
Affiliation:
ICMAB-CSIC, Campus de la Universitat Autònoma de Barcelona, 08193 Bellaterra, Spain
*
a)Address all correspondence to this author.e-mail: benoit.rousseau@cnrs-orleans.fr
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Abstract

A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa2Cu3O6+x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO3 substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.

Keywords

Metalorganic depositionRaman spectroscopyX-ray diffraction

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Type
Rapid Communications
Information
Journal of Materials Research , Volume 20 , Issue 12 , December 2005 , pp. 3270 - 3273
Copyright
Copyright © Materials Research Society 2005

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References

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