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Published online by Cambridge University Press: 06 March 2019
A diffractometer equipped with a gas proportional counter and pulse-height analyzer provides a very satisfactory means of recording the X-ray diffraction patterns of chromium-containing materials with Cu K α radiation. The fluorescent chromium K radiation can be rejected along with much of the white background radiation without appreciable loss of Cu K α intensity, and the advantages of copper over chromium or molybdenum radiation can be fully utilized. This is illustrated by an X-ray diffraction study of coprecipitated chromia-alumina catalysts, in which the chromium concentration varies between 0 and 37 w, %. At each chromium concentration the precipitate was studied in the washed and dried state, as well as after calcination at 500, 750, and 1400°C. X-ray diffraction patterns are presented to show the phase transformations and sample inhomogenelties that were observed.