Hostname: page-component-54dcc4c588-trf7k Total loading time: 0 Render date: 2025-10-09T04:47:05.275Z Has data issue: false hasContentIssue false
  • English
  • Français

Energy Dispersive Analysis for Quality Assurance of Aluminum Alloys

Published online by Cambridge University Press:  06 March 2019

Yury M. Gurvich
Yury M. Gurvich*
Affiliation:
Receiving Inspection Rockwell International Corporation Downey, California
Get access

Extract

Traditionally, aluminum has been the most important raw metal material for the aerospace industry. Since the major part of aluminum production is consumed for aircraft, military, space, and other programs, sponsored or regulated by the U. S. Government, quality of various Al alloys is under governmental control. The representatives of the governmental agency are placed at each aluminum plant in order to assure a high quality of production on-site. A fast and reliable analytical method is essential to control the production process and to keep chemical composition of the alloys inside specified ranges.

Information

Type
V. XRF Applications; Fuels and Lubricants, Metals and Alloys, Geological, Heavy Element, Other
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 265 - 272
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Horelco Reporter, Vol. 29, No. 2, p. 45-48, July 1982.Google Scholar
2. Analyst, No. 2, p. 13-15, June 1982.Google Scholar
3. Muller, R. O., Keil, K., Spectrochemical Analysis by X-Ray Fluorescence, 1972, Plenum Press, NY.Google Scholar
4. Harmon, J.C., Wyld, G., Yao, T.C., Otvos, J.W., “X-Ray Fluorescence Analysis of Stainless Steels and Low Alloy Steels Using Secondary Targets and the EXACT. rogram”, Advances in X-Ray Analysis, V. 22, PP. 25–335.Google Scholar